KB番号:100
概要説明:腐食性ガス+電界によるAgの短絡
ストレス大分類:湿度+電界
ストレス小分類:腐食性ガス+電界
故障メカニズム大分類:拡散
故障メカニズム小分類:毛髪銀
故障フェーズⅠ:銀イオンと電子の接触
故障フェーズⅡ:銀の生成
故障モード:短絡
アイテム:Ag
故障の発生原理:
故障モードの検出:SEM?
SEM
走査型電子顕微鏡(Scanning Electron Microscope)
主な業界・分野:電子デバイス
抑制対策(再発防止策):
抑制対策(評価基準):
備考:
website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website website